专利名称：ARTICLE INSPECTION DEVICE发明人：▲高▼本 智仙,稲尾 和彦,辻 毅,吉村 昌倫申请号：JP2014235113申请日：20141119公开号：JP6480714B2公开日：20190313
摘要：Provided is an article inspection apparatus which does not arrange the LEDmounting body by mistake at the time of mounting or replacing or the like and does notcause unevenness of irradiation light. The article inspection apparatus 1 includes aconveying device 2 that places an article on a translucent conveyor belt 16 and moves thearticle, a support base 3 that supports the conveying device 2, an irradiation device 4 thatirradiates the conveyor belt 16 from below by disposing the LED mounting body 53 onwhich a semiconductor light emitting element is mounted and fixed on a printed circuitboard 57, and a control device 5 that operates and controls the conveyor belt 16 andcontrols light emission of the semiconductor light emitting element. In the LED mountingbody 53, the white chip 58 and the RGB chip 59 are arranged in parallel on the printedcircuit board 57 at predetermined intervals, and the wiring coupler 60 is disposedbetween the opposing white chip 58 and the RGB chip 59.
申请人：サムテック・イノベーションズ株式会社
地址：岡山県津山市平福１７６
国籍：JP
代理人：橋本 清
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