专利名称：Calibrating temperature coefficients for
integrated circuits
发明人：Bartosz Gajda申请号：US14085681申请日：20131120公开号：US09112513B2公开日：20150818
专利附图：
摘要：A calibration system and method are disclosed that include a first bias currentgenerator configured for generating a first bias current that is proportional to absolutetemperature (PTAT) and a second bias current generator configured for generating a
second bias current that is complementary to absolute temperature (CTAT). The first andsecond bias currents are copied, multiplied and then summed into a total output biascurrent, which can be used to bias an electronic circuit. A temperature coefficient iscalibrated by changing a ratio of the first and second bias current contributions to thetotal output bias current, while maintaining the same total output bias current level for agiven temperature.
申请人：Atmel Corporation
地址：San Jose CA US
国籍：US
代理机构：Fish & Richardson P.C.
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