专利名称：Systems and methods for controlling of
electro-migration
发明人：Hayden Clavie Cranford, Jr.,Louis Lu-Chen
Hsu,James Stephen Mason,Chih-Chao Yang
申请号：US11942241申请日：20071119公开号：US07471101B2公开日：20081230
专利附图：
摘要：Systems and methods for controlling electro-migration, and reducing thedeleterious effects thereof, are disclosed. Embodiments provide for reversal of an
applied voltage to an integrated circuit when a measurement indicative of an extent ofelectro-migration indicates that a healing cycle of operation is warranted. During thehealing cycle, circuits of the integrated circuit function normally, but electro-migrationeffects are reversed. In one embodiment, micro-electro-mechanical switches are providedat a lowest level of metallization to switch the direction of current through the levels ofmetallization of the integrated circuit. In another embodiment, if the measurementindicative of the extent of electro-migration exceeds a reference level by a specifiableamount, then the voltage applied to the integrated circuit is reversed in polarity to causecurrent to switch directions to counter electro-migration. A plurality of switches areprovided to switch current directions through a lowest level of metallization so that thecircuits function normally even though the polarity of the applied voltage has beenreversed.
申请人：Hayden Clavie Cranford, Jr.,Louis Lu-Chen Hsu,James Stephen Mason,Chih-Chao Yang
地址：Cary NC US,Fishkill NY US,Eastleigh GB,Poughkeepsie NY US
国籍：US,US,GB,US
代理机构：Schubert Osterrieder & Nickelson PLLC
代理人：Joscelyn G. Cockburn
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